Nanometer Technology Designs High-quality Delay Tests

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Nanometer Technology Designs High-quality Delay Tests

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Nanometer Technology Designs High-quality Delay Tests

$229.00

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Nanometer Technology Designs High-quality Delay Tests

Supply Noise (including Ir-drop, Ground Bounce, And Ldidt) Effects On Chip Performance, High Test Pattern Volume, Low Faultdefect Coverage, Small Delay Defect Test Pattern Generation, High Cost Of Test Implementation And Application, And Utilizing Low-cost Testers Are Among These Challenges.
  • Brand: Springer Nature B.V
  • Category: Computing & Internet
  • Format: Hardcover
  • Language: English
  • Publication Date: 2008-01-16
  • Publisher / Label: Springer Nature B.V
  • Author: Mohammad Tehranipoor
  • Number of Pages: 304
  • Fruugo ID: 550925722-1115603932
  • ISBN: 9780387764863
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